Pitch-up phenomenon characterization by means of HW and PIV measurement techniques

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dc.contributor.authorBarbagallo, D.
dc.contributor.authorDe Gregorio, F.
dc.contributor.authorTino, N.
dc.date.accessioned2016-06-30T11:50:04Z
dc.date.available2016-06-30T11:50:04Z
dc.date.issued2000
dc.identifier.other100_16
dc.identifier.urihttp://hdl.handle.net/20.500.11881/533
dc.language.isoen
dc.subject.otherTesting
dc.titlePitch-up phenomenon characterization by means of HW and PIV measurement techniques

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